4 results
Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue 3 / May 2001
- Published online by Cambridge University Press:
- 02 February 2002, pp. 287-291
- Print publication:
- May 2001
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Cross-sectional Specimen Preparation and Observation of a Plasma Sprayed Coating Using a Focused Ion Beam/Transmission Electron Microscopy System
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue 3 / May 2000
- Published online by Cambridge University Press:
- 29 January 2003, pp. 218-223
- Print publication:
- May 2000
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A FIB Micro-Sampling Technique and a Site-Specific TEM Specimen Preparation Method for Precision Materials Characterization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 636 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D9.35.1
- Print publication:
- 2000
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Method for Cross-sectional Transmission Electron Microscopy Specimen Preparation of Composite Materials Using a Dedicated Focused Ion Beam System
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue 5 / September 1999
- Published online by Cambridge University Press:
- 08 August 2002, pp. 365-370
- Print publication:
- September 1999
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